ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,528,160, issued on Jan. 20, was assigned to Infar Industrial Co. Ltd. (Chang-Hua County, Taiwan). "Indexable wrench" was invented by Tai Hung C... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,549, issued on Jan. 20, was assigned to Maxeon Solar Pte. Ltd. (Singapore). "Metallization and stringing for back-contact solar cells" was ... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,454, issued on Jan. 20, was assigned to CHENGDU QINCHUAN IOT TECHNOLOGY Co. LTD. (Chengdu, China). "Methods, systems, and media for gas pip... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,518, issued on Jan. 20, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Length compensating waveguide for an optical circuit" was inven... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,527,303, issued on Jan. 20, was assigned to Soochow university (Suzhou, China) and Suzhou Industrial Park Center for Disease Control and Prevent... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,531,304, issued on Jan. 20, was assigned to SANYO Electric Co. Ltd. (Osaka, Japan). "Electricity storage device and insulating holder" was inve... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,528,696, issued on Jan. 20, was assigned to Lawrence Semiconductor Research Laboratory Inc. (Tempe, Ariz.). "Engineered substrates, free-standi... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,532,757, issued on Jan. 20, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Semiconductor package" was invented by Hui M... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,504, issued on Jan. 20, was assigned to Haier US Appliance Solutions Inc. (Wilmington, Del.). "Adjustable air flow system for a refrigerato... Read More
ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,880, issued on Jan. 20, was assigned to WISTRON Corp. (New Taipei, Taiwan). "Training system and method, testing system and method, data fi... Read More